I-CEMS yokushiswa kukadoti oqinile

Incazelo Yomkhiqizo

Izitshalo zokushiswa kwemfucuza yasekhaya zidingeka ukuthi zenze ukuqapha okuzenzakalelayo, okuqhubekayo kanye ne-inthanethi kwezingxenye eziyinhloko zegesi eshiswayo. Izinto zokuqapha eziyisisekelo zifaka i-HCl, i-SO₂, i-NOₓ kanye nensimu, kuyilapho i-CO ne-HF nayo idinga ukutholwa kwezinye izikhathi. I-Model TK-1000 Continuous Emission Monitoring System (CEMS) yegesi eshiswa udoti eqinile/yegesi yasendlini isebenzisa ubuchwepheshe obufana ne-DOAS UV differential absorption spectroscopy kanye ne-tunable diode laser absorption spectroscopy (TDLAS). Iyakwazi ukukala amapharamitha amaningi afaka i-SO₂, NOₓ, O₂ ne-HCl. Ngesakhiwo esilula, ukuklama kwe-modular, ukuzinza okuphezulu kanye nezindleko eziphansi zokusebenza, uhlelo lufakwe ekamelweni lesiteshi sokuqapha ukuze kube lula ukusebenza nokugcinwa.

Buza ku-inthanethi

Imodeli

I-TK-1000

XHUMANA NATHI

Imininingwane Yezobuchwepheshe

A. Measurement Principle: UV differential absorption (DOAS) for NO and SO₂; i-electrochemistry ye-O₂

I-Zero Drift: ≤±2% F.S.
I-Span Drift: ≤±2% F.S.
Iphutha Lenkomba: ≤±2% F.S.
Umkhawulo Wokuthola: ≤0.5% F.S.
Response Time (T90): ≤75s

B. I-Particulate Matter Monitor (SDUST-100)

Measurement Range: Configurable range
Zero Drift: ±2% F.S./24h
I-Span Drift: ±2% F.S./24h

C. Temperature, Pressure and Flow Monitor (SVPT-100)

Ibanga Lokulinganisa Izinga lokushisa: 0–500℃
Ukunemba: ≤±3℃
Pressure Measurement Range: ±10kPa
Flow Rate Measurement Range: (2～40)m/s
Accuracy: Relative error ≤±10% when flow rate ＞10m/s; relative error ≤±12% when flow rate ≤10m/s

D. Humidity Monitor (Model SSD-100)

Measurement Range: (0～40)vol%
Accuracy: Absolute error ≤±1.5% when humidity ≤5%; iphutha elihlobene ≤±25% lapho umswakama ＞5%

Izinzuzo Zobuchwepheshe

Zonke izinsimbi zohlelo oluphelele ziyazithuthukisa, zinomklamo ojwayelekile futhi oyimodulayo wokuqamba okulula nokuthembekile.
Ngokusekelwe kubuchwepheshe be-UV differential absorption spectroscopy (DOAS), ukulinganisa okuhlanganyelwe kwamapharamitha amaningi kanye ne-algorithm yokukhansela ukuphazamiseka kuzuza ukukhukhuleka okuphansi kakhulu okuyiziro kanye nokukhukhuleka ebangeni elibanzi lokushisa.
Ukwamukela ukulawula kwe-PLC ngezinga eliphezulu lokuzenzakalela, isikrini sekristalu ewuketshezi sibonisa indlela yokugeleza kwesistimu futhi siqoqa ulwazi oluningiliziwe lwesimo sohlelo, olungasebenza njengesisetshenziswa esivuna kakhulu sokuqinisekiswa kokuqinisekiswa kwedatha.
Umklamo ende othembekile we-optical cell cell uvumela indlela yokubona ukuthi ifinyelele ku-760 mm.
Isekela ukulinganisa kokuhlushwa okuphansi kakhulu ngokulungiswa okungafika ku-0.1 ppm.
Ububanzi be-spectral be-laser semiconductor bungaphansi kuka-0.001 nm, okugwema ukuphazamiseka okubangelwa uthuli nomswakama.